IEEE - Institute of Electrical and Electronics Engineers, Inc. - Ghost imaging for a reflected object with large incident angles

Author(s): Suqin Nan ; Yanfeng Bai ; Xiaohui Shi ; Qian Shen ; Hengxing Li ; Lijie Qu ; Xiquan Fu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Online): 1943-0655
DOI: 10.1109/JPHOT.2017.2693206
Regular:

Incident angle of light source is a key factor that affects imaging resolution of direct optical imaging for a reflected target. For a large incident angle, it is easy to form the "blind area" in... View More

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