IEEE - Institute of Electrical and Electronics Engineers, Inc. - Power Grid Electromigration Checking using Physics-Based Models

Author(s): Sandeep Chatterjee ; Valeriy Sukharev ; Farid N. Najm
Sponsor(s): IEEE Council on Electronic Design Automation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Paper): 0278-0070
ISSN (Online): 1937-4151
DOI: 10.1109/TCAD.2017.2666723
Regular:

Due to technology scaling, electromigration (EM) signoff has become increasingly difficult, mainly due to the use of inaccurate methods for EM assessment, such as the empirical Black's model. In... View More

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