IEEE - Institute of Electrical and Electronics Engineers, Inc. - Accelerated and Reliable Analog Circuits Yield Analysis using SMT Solving Techniques

Author(s): Ons Lahiouel ; Mohamed H. Zaki ; Sofiene Tahar
Sponsor(s): IEEE Council on Electronic Design Automation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Paper): 0278-0070
ISSN (Online): 1937-4151
DOI: 10.1109/TCAD.2017.2651807
Regular:

Existing yield analysis methods are computationally expensive and generally encounter challenges with highdimensional process parameters space. In this paper, we propose a new method for... View More

Advertisement