IEEE - Institute of Electrical and Electronics Engineers, Inc. - Experience of Data Analytics in EDA and Test - Principles, Promises, and Challenges

Author(s): Li-C. Wang
Sponsor(s): IEEE Council on Electronic Design Automation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Paper): 0278-0070
ISSN (Online): 1937-4151
DOI: 10.1109/TCAD.2016.2621883
Regular:

Applying modern data mining in Electronic Design Automation (EDA) and Test has become an area of growing interest in recent years. This paper reviews some of the recent developments in the area.... View More

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