IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fine-Grained Aging-Induced Delay Prediction Based on the Monitoring of Run-Time Stress

Author(s): Arunkumar Vijayan ; Abhishek Koneru ; Saman Kiamehr ; Krishnendu Chakrabarty ; Mehdi B. Tahoori
Sponsor(s): IEEE Council on Electronic Design Automation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Paper): 0278-0070
ISSN (Online): 1937-4151
DOI: 10.1109/TCAD.2016.2620903
Regular:

Run-time solutions based on online monitoring and adaptation are required for resilience in nanoscale integrated circuits, as design-time solutions and guard bands are no longer sufficient. Bias... View More

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