IEEE - Institute of Electrical and Electronics Engineers, Inc. - C-YES: An Efficient Parametric Yield Estimation Approach for Analog and Mixed-Signal Circuits Based on Multi-Corner-Multi-Performance Correlations

Author(s): Wei Zeng ; Hengliang Zhu ; Xuan Zeng ; Dian Zhou ; Rueywen Liu ; Xin Li
Sponsor(s): IEEE Council on Electronic Design Automation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Paper): 0278-0070
ISSN (Online): 1937-4151
DOI: 10.1109/TCAD.2016.2613927
Regular:

Parametric yield estimation is a critical task for design and validation of analog and mixed-signal (AMS) circuits. However, the computational cost for yield estimation based on Monte Carlo (MC)... View More

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