IEEE - Institute of Electrical and Electronics Engineers, Inc. - Improving Diagnostic Resolution of Failing ICs through Learning

Author(s): Yang Xue ; Xin Li ; R.D. Blanton
Sponsor(s): IEEE Council on Electronic Design Automation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Paper): 0278-0070
ISSN (Online): 1937-4151
DOI: 10.1109/TCAD.2016.2611499
Regular:

Diagnosis is the first analysis step for uncovering the root cause of failure for a defective integrated logic circuit. The conventional objective of identifying failure locations has been... View More

Advertisement