IEEE - Institute of Electrical and Electronics Engineers, Inc. - Accurate Multi-segment Probability Density Estimation Through Moment Matching

Author(s): Rahul Krishnan ; Wei Wu ; Srinivas Bodapati ; Lei He
Sponsor(s): IEEE Council on Electronic Design Automation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Paper): 0278-0070
ISSN (Online): 1937-4151
DOI: 10.1109/TCAD.2016.2562923
Regular:

The impact of process variations continues to grow as transistor feature size shrinks. Such variations in transistor parameters lead to variations and unpredictability in circuit output and may... View More

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