IEEE - Institute of Electrical and Electronics Engineers, Inc. - Gathering Process Data in Low-Voltage Systems by Enhanced Event-Driven Metering

Author(s): Mikhail Simonov ; Husheng Li ; Gianfranco Chicco
Sponsor(s): IEEE Systems Council
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1 - 12
ISSN (CD): 2373-7816
ISSN (Paper): 1932-8184
ISSN (Online): 1937-9234
DOI: 10.1109/JSYST.2015.2390073
Regular:

Event-driven metering is an emergent paradigm enabling significant data compression enhancement with respect to the conventional time domain metering techniques. This paper first discusses the... View More

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