Tsinghua University Press Ltd. - Scan strategy in electron beam selective melting

Author(s): Wei Lu ; Feng Lin ; Jiandong Han ; Haibo Qi ; Naisheng Yan
Publisher: Tsinghua University Press Ltd.
Publication Date: 1 June 2009
Volume: 14
Page(s): 120 - 126
ISSN (Electronic): 1007-0214
DOI: 10.1016/S1007-0214(09)70078-1
Regular:

In electron beam selective melting process, powder pushed-away phenomena and uneven temperature field are two main obstacles, which are greatly associated with the electron beam scan mode. In this... View More

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