China Aerospace Science and Industry Corporation (CASIC) - Low overhead design-for-testability for scan-based delay fault testing

Author(s): Yang Decai ; Chen Guangju ; Xie Yongle
Publisher: China Aerospace Science and Industry Corporation (CASIC)
Publication Date: 1 March 2007
Volume: 18
Page(s): 40 - 44
ISSN (Electronic): 1004-4132
DOI: 10.1016/S1004-4132(07)60047-4
Regular:

An efficient design-for-testability (DFT) technique is proposed to achieve low overhead for scan-based delay fault testing. Existing techniques for delay test such as skewed-load or... View More

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