Tsinghua University Press Ltd. - Test mismatch in switched-current circuits using wavelet analysis

Author(s): Jierong Guo ; Yigang He ; Meirong Liu ; Shengxue Tang ; Hongmin Li
Publisher: Tsinghua University Press Ltd.
Publication Date: 1 July 2007
Volume: 12
Page(s): 229 - 234
ISSN (Electronic): 1007-0214
DOI: 10.1016/S1007-0214(07)70115-3
Regular:

Errors of mismatch and currents calibration caused by channel geometrical variety in switchedcurrent are investigated in this paper. The relation and computing of mismatch and sensitivity are... View More

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