Tsinghua University Press Ltd. - A novel register allocation algorithm for testability

Author(s): Qiang Sun ; Tao Zhou ; Haijun Li
Publisher: Tsinghua University Press Ltd.
Publication Date: 1 July 2007
Volume: 12
Page(s): 57 - 60
ISSN (Electronic): 1007-0214
DOI: 10.1016/S1007-0214(07)70084-6
Regular:

In the course of high-level synthesis of integrate circuit, the hard-to-test structure caused by irrational schedule and allocation reduces the testability of circuit. In order to improve the... View More

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