Tsinghua University Press Ltd. - Deterministic circular self test path

Author(s): Ke Wen ; Yu Hu ; Xiaowei Li
Publisher: Tsinghua University Press Ltd.
Publication Date: 1 July 2007
Volume: 12
Page(s): 20 - 25
ISSN (Electronic): 1007-0214
DOI: 10.1016/S1007-0214(07)70078-0
Regular:

Circular self test path (CSTP) is an attractive technique for testing digital integrated circuits(IC) in the nanometer era, because it can easily provide at-speed test with small test data volume... View More

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