Tsinghua University Press Ltd. - On-chip multi-giga bit cycle-to-cycle jitter measurement circuit

Author(s): Jingkai Zhang ; Chung Len Lee ; Chao Tian ; Fei Yu
Publisher: Tsinghua University Press Ltd.
Publication Date: 1 July 2007
Volume: 12
Page(s): 1 - 7
ISSN (Electronic): 1007-0214
DOI: 10.1016/S1007-0214(07)70075-5

This paper presents an on-chip measurement circuit to measure multi-giga bit cycle-to-cycle jitter based on the vernier oscillator (VO), which is inherited from the famous vernier delay line. The... View More