China Aerospace Science and Industry Corporation (CASIC) - Five modified boundary scan adaptive test generation algorithms

Author(s): Niu Chunping ; Ren Zheping ; Yao Zongzhong
Publisher: China Aerospace Science and Industry Corporation (CASIC)
Publication Date: 1 December 2006
Volume: 17
Page(s): 760 - 763
ISSN (Electronic): 1004-4132
DOI: 10.1016/S1004-4132(07)60012-7
Regular:

To study the diagnostic problem of Wire-OR (W-O) interconnect fault of PCB (Printed Circuit Board), five modified boundary scan adaptive algorithms for interconnect test are put forward. These... View More

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