IEEE - Institute of Electrical and Electronics Engineers, Inc. - Bayesian Time-of-Flight for Realtime Shape, Illumination and Albedo

Author(s): Amit Adam ; Christoph Dann ; Omer Yair ; Shai Mazor ; Sebastian Nowozin
Sponsor(s): IEEE Computer Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2017
Volume: 39
Page(s): 851 - 864
ISSN (CD): 2160-9292
ISSN (Paper): 0162-8828
DOI: 10.1109/TPAMI.2016.2567379
Regular:

We propose a computational model for shape, illumination and albedo inference in a pulsed time-of-flight (TOF) camera. In contrast to TOF cameras based on phase modulation, our camera enables... View More

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