IEEE - Institute of Electrical and Electronics Engineers, Inc. - An Improved SDA Based Defect Prediction Framework for Both Within-Project and Cross-Project Class-Imbalance Problems

Author(s): Xiao-Yuan Jing ; Fei Wu ; Xiwei Dong ; Baowen Xu
Sponsor(s): IEEE Comput. Soc. Tech. Council on Software Eng.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2017
Volume: 43
Page(s): 321 - 339
ISSN (Paper): 0098-5589
ISSN (Online): 1939-3520
DOI: 10.1109/TSE.2016.2597849
Regular:

Background. Solving the class-imbalance problem of within-project software defect prediction (SDP) is an important research topic. Although some class-imbalance learning methods have been... View More

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