IEEE - Institute of Electrical and Electronics Engineers, Inc. - Beam Quality Deterioration in Dense Wavelength Beam-Combined Broad-Area Diode Lasers

Author(s): Matthias Haas ; Simon Rauch ; Simon Nagel ; Rolf Beibwanger ; Thomas Dekorsy ; Hagen Zimer
Sponsor(s): IEEE Lasers and Electro-Optics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2017
Volume: 53
Page(s): 1 - 11
ISSN (Electronic): 1558-1713
ISSN (Paper): 0018-9197
DOI: 10.1109/JQE.2017.2686358
Regular:

We study various effects of beam quality deterioration in dense wavelength beam-combined direct diode laser systems based on broad-area laser diode bars of different filling factors. We mainly... View More

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