IEEE - Institute of Electrical and Electronics Engineers, Inc. - KKCV-GA-Based Method for Optimal Analog Test Point Selection

Author(s): Xiaofeng Tang ; Aiqiang Xu ; Shuangcheng Niu
Sponsor(s): IEEE Instrumentation and Measurement Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2017
Volume: 66
Page(s): 24 - 32
ISSN (Electronic): 1557-9662
ISSN (Paper): 0018-9456
DOI: 10.1109/TIM.2016.2614752
Regular:

A novel diagnosis oriented method for optimal analog test point selection is proposed. The method uses a kernel density estimation on $K$ -nearest neighbors-based cross-validation to evaluate the... View More

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