IEEE - Institute of Electrical and Electronics Engineers, Inc. - Efficient Algorithms for Noisy Group Testing

Author(s): Sheng Cai ; Mohammad Jahangoshahi ; Mayank Bakshi ; Sidharth Jaggi
Sponsor(s): IEEE Information Theory Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2017
Volume: 63
Page(s): 2,113 - 2,136
ISSN (Paper): 0018-9448
ISSN (Online): 1557-9654
DOI: 10.1109/TIT.2017.2659619
Regular:

Group-testing refers to the problem of identifying (with high probability) a (small) subset of D defectives from a (large) set of N items via a "small" number of "pooled" tests (i.e., tests that... View More

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