IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Method for Improving Overlapping of Testing and Design

Author(s): Khadija Tahera ; Chris Earl ; Claudia Eckert
Sponsor(s): IEEE Technology Management Council
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2017
Volume: 64
Page(s): 179 - 192
ISSN (Paper): 0018-9391
ISSN (Online): 1558-0040
DOI: 10.1109/TEM.2017.2654223
Regular:

Testing is a critical activity in product development. The academic literature provides limited insight about overlapping between upstream testing and downstream design tasks, especially in... View More

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