IEEE - Institute of Electrical and Electronics Engineers, Inc. - Determining Junction Temperature of LEDs by the Relative Reflected Intensity of the Incident Exciting Light

Author(s): Yao Xiao ; Ting-Zhu Wu ; Si-Jia Dang ; Yu-Lin Gao ; Yue Lin ; Li-Hong Zhu ; Zi-Quan Guo ; Yi-Jun Lu ; Zhong Chen
Sponsor(s): IEEE Electron Devices Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2017
Volume: 64
Page(s): 2,257 - 2,260
ISSN (Paper): 0018-9383
ISSN (Online): 1557-9646
DOI: 10.1109/TED.2017.2678513
Regular:

Relative reflected intensity of the incident exciting light is proposed to measure the junction temperature of light-emitting diodes (LEDs) under test. Reflectance spectra at a wide junction... View More

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