IEEE - Institute of Electrical and Electronics Engineers, Inc. - Reliable Time Exponents for Long Term Prediction of Negative Bias Temperature Instability by Extrapolation

Author(s): Rui Gao ; Azrif B. Manut ; Zhigang Ji ; Jigang Ma ; Meng Duan ; Jian Fu Zhang ; Jacopo Franco ; Sharifah Wan Muhamad Hatta ; Wei Dong Zhang ; Ben Kaczer ; David Vigar ; Dimitri Linten ; Guido Groeseneken
Sponsor(s): IEEE Electron Devices Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2017
Volume: 64
Page(s): 1,467 - 1,473
ISSN (Paper): 0018-9383
ISSN (Online): 1557-9646
DOI: 10.1109/TED.2017.2669644
Regular:

To predict the negative bias temperature instability (NBTI) toward the end of pMOSFETs' ten years lifetime, power-law-based extrapolation is the industrial standard method. The prediction accuracy... View More

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