IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Novel TCAD-Based Thermal Extraction Approach for Nanoscale FinFETs

Author(s): U. Sajesh Kumar ; V. Ramgopal Rao
Sponsor(s): IEEE Electron Devices Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2017
Volume: 64
Page(s): 1,404 - 1,407
ISSN (Paper): 0018-9383
ISSN (Online): 1557-9646
DOI: 10.1109/TED.2017.2657626
Regular:

Self-heating and thermal modeling in fin-shaped FETs (FinFETs) are studied in this brief using calibrated 3-D TCAD simulations. Using the second order RthCth network... View More

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