IEEE - Institute of Electrical and Electronics Engineers, Inc. - Anomalous Transconductance in Long Channel Halo Implanted MOSFETs: Analysis and Modeling

Author(s): Harshit Agarwal ; Chetan Gupta ; Sagnik Dey ; Sourabh Khandelwal ; Chenming Hu ; Yogesh Singh Chauhan
Sponsor(s): IEEE Electron Devices Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 February 2017
Volume: 64
Page(s): 376 - 383
ISSN (Paper): 0018-9383
ISSN (Online): 1557-9646
DOI: 10.1109/TED.2016.2640279
Regular:

In this paper, we report anomalous behavior of transconductance (gm) in halo implanted MOSFET for linear and saturation regions across both gate and body biases. The gm... View More

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