IEEE - Institute of Electrical and Electronics Engineers, Inc. - Consistency of the Two Component Composite Modeling Framework for NBTI in Large and Small Area p-MOSFETs

Author(s): Ankush Chaudhary ; Beryl Fernandez ; Narendra Parihar ; Souvik Mahapatra
Sponsor(s): IEEE Electron Devices Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2017
Volume: 64
Page(s): 256 - 263
ISSN (Paper): 0018-9383
ISSN (Online): 1557-9646
DOI: 10.1109/TED.2016.2630311
Regular:

Consistency of the recently proposed deterministic composite modeling framework for Negative Bias Temperature Instability (NBTI) in large area devices is verified for stochastic NBTI in small area... View More

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