IEEE - Institute of Electrical and Electronics Engineers, Inc. - Development of One-Dimensional Norm Detector for Nanosecond-Level Transient Electric Field Measurement

Author(s): Xu Kong ; Yan-Zhao Xie ; Qi Li ; Shao-Yin He ; Yin-Bin Jin
Sponsor(s): IEEE Electromagnetic Compatibility Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2017
Volume: 59
Page(s): 1,035 - 1,040
ISSN (Electronic): 1558-187X
ISSN (Paper): 0018-9375
DOI: 10.1109/TEMC.2016.2645943
Regular:

This paper develops a one-dimensional norm detector for nanosecond-level transient electric field (E-field) measurement based on the digital measurement technology. It has two main advantages over... View More

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