IEEE - Institute of Electrical and Electronics Engineers, Inc. - Signal Integrity Design and Analysis of a Multilayer Test Interposer for LPDDR4 Memory Test With Silicone Rubber-Based Sheet Contact

Author(s): Jonghoon J. Kim ; Heegon Kim ; Daniel H. Jung ; Sumin Choi ; Jaemin Lim ; Youngwoo Kim ; Junyong Park ; Hyesoo Kim ; Dongho Ha ; Michael Bae ; Joungho Kim
Sponsor(s): IEEE Electromagnetic Compatibility Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2017
Volume: 59
Page(s): 1,239 - 1,251
ISSN (Electronic): 1558-187X
ISSN (Paper): 0018-9375
DOI: 10.1109/TEMC.2016.2639524
Regular:

As the data rate of Low Power Double Data Rate 4 (LPDDR4) memory now exceeds 3.2 Gb/s, it is becoming more difficult to meet the target specifications. While testing has become of utmost... View More

Advertisement