IEEE - Institute of Electrical and Electronics Engineers, Inc. - Modeling of Transients on IC Supply Rails Caused by ESD During Operation

Author(s): Thomas Ungru ; Wolfgang Wilkening ; Renato Negra
Sponsor(s): IEEE Electromagnetic Compatibility Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2017
Volume: 59
Page(s): 910 - 918
ISSN (Paper): 0018-9375
ISSN (Online): 1558-187X
DOI: 10.1109/TEMC.2016.2635108
Regular:

Electrostatic discharge (ESD) gun stress during operation is especially critical if it perturbs the supply system of an integrated circuit (IC). This paper presents a modeling technique of a... View More

Advertisement