IEEE - Institute of Electrical and Electronics Engineers, Inc. - Special Issue on EMC in the Near-Field: Theory, Measurements, and Applications Foreword

Author(s): Marcello D'Amore ; Perry F. Wilson ; Er-Ping Li ; Wen-Yan Yin
Sponsor(s): IEEE Electromagnetic Compatibility Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2017
Volume: 59
Page(s): 554 - 556
ISSN (Paper): 0018-9375
ISSN (Online): 1558-187X
DOI: 10.1109/TEMC.2016.2641538
Regular:

The papers in this special issue focus on theory, measurements, and applications for electromagnetics in near-field. Numerous electromagnetic compatibility (EMC) problems occur in the near-field... View More

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