IEEE - Institute of Electrical and Electronics Engineers, Inc. - Sparse Emission Source Microscopy for Rapid Emission Source Imaging

Author(s): Ling Zhang ; Victor V. Khilkevich ; Xiangyang Jiao ; Xiao Li ; Sukhjinder Toor ; Alpesh U. Bhobe ; Kyoungchoul Koo ; David Pommerenke ; James L. Drewniak
Sponsor(s): IEEE Electromagnetic Compatibility Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2017
Volume: 59
Page(s): 729 - 738
ISSN (Paper): 0018-9375
ISSN (Online): 1558-187X
DOI: 10.1109/TEMC.2016.2639526
Regular:

Emission source microscopy (ESM) technique can be utilized for the localization of electromagnetic interference sources in complex and large systems. This paper presents a sparse and nonuniform... View More

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