IEEE - Institute of Electrical and Electronics Engineers, Inc. - Improving 3D DRAM Fault Tolerance Through Weak Cell Aware Error Correction

Author(s): Hao Wang ; Kai Zhao ; Minjie Lv ; Xuebin Zhang ; Hongbin Sun ; Tong Zhang
Sponsor(s): IEEE Comput. Soc. Tech. Committee on Distributed Process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2017
Volume: 66
Page(s): 820 - 833
ISSN (Paper): 0018-9340
DOI: 10.1109/TC.2016.2621758
Regular:

Although the emerging 3D DRAM products can significantly improve the computing system performance, the relatively high cost is one of the most critical issues that prevent their wide real-life... View More

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