IEEE - Institute of Electrical and Electronics Engineers, Inc. - Short Code: An Efficient RAID-6 MDS Code for Optimizing Degraded Reads and Partial Stripe Writes

Author(s): Yingxun Fu ; Jiwu Shu ; Xianghong Luo ; Zhirong Shen ; Qingda Hu
Sponsor(s): IEEE Comput. Soc. Tech. Committee on Distributed Process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2017
Volume: 66
Page(s): 127 - 137
ISSN (Paper): 0018-9340
DOI: 10.1109/TC.2016.2576461
Regular:

As reliability requirements are increasingly important in both clusters and data centers, RAID-6, which can tolerate any two concurrent disk failures, has been widely used in modern storage... View More

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