IEEE - Institute of Electrical and Electronics Engineers, Inc. - An On-Chip Error Detection Method to Reduce the Post-Silicon Debug Time

Author(s): Hyunggoy Oh ; Taewoo Han ; Inhyuk Choi ; Sungho Kang
Sponsor(s): IEEE Comput. Soc. Tech. Committee on Distributed Process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2017
Volume: 66
Page(s): 38 - 44
ISSN (Paper): 0018-9340
DOI: 10.1109/TC.2016.2561920
Regular:

Debug time has become a major issue in post silicon debug because of the increasingly complicated nature of circuit design. However, reducing debug time is a major challenge because of the limited... View More

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