IEEE - Institute of Electrical and Electronics Engineers, Inc. - Image Forgery Localization via Integrating Tampering Possibility Maps

Author(s): Haodong Li ; Weiqi Luo ; Xiaoqing Qiu ; Jiwu Huang
Sponsor(s): IEEE Signal Processing Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2017
Volume: 12
Page(s): 1,240 - 1,252
ISSN (Paper): 1556-6013
ISSN (Online): 1556-6021
DOI: 10.1109/TIFS.2017.2656823
Regular:

Over the past decade, many efforts have been made in passive image forensics. Although it is able to detect tampered images at high accuracies based on some carefully designed mechanisms,... View More

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