IEEE - Institute of Electrical and Electronics Engineers, Inc. - Randomness Evaluation With the Discrete Fourier Transform Test Based on Exact Analysis of the Reference Distribution

Author(s): Hiroki Okada ; Ken Umeno
Sponsor(s): IEEE Signal Processing Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2017
Volume: 12
Page(s): 1,218 - 1,226
ISSN (Paper): 1556-6013
ISSN (Online): 1556-6021
DOI: 10.1109/TIFS.2017.2656473
Regular:

In this paper, we study the problems in the discrete fourier transform (DFT) test included in the National Institute of Standards and Technology (NIST) SP 800-22 released by the NIST, which is a... View More

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