IEEE - Institute of Electrical and Electronics Engineers, Inc. - Q-Learning-Based Vulnerability Analysis of Smart Grid Against Sequential Topology Attacks

Author(s): Jun Yan ; Haibo He ; Xiangnan Zhong ; Yufei Tang
Sponsor(s): IEEE Signal Processing Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2017
Volume: 12
Page(s): 200 - 210
ISSN (Paper): 1556-6013
ISSN (Online): 1556-6021
DOI: 10.1109/TIFS.2016.2607701
Regular:

Recent studies on sequential attack schemes revealed new smart grid vulnerability that can be exploited by attacks on the network topology. Traditional power systems contingency analysis needs to... View More

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