IEEE - Institute of Electrical and Electronics Engineers, Inc. - Remaining Useful Life Estimation by Empirical Mode Decomposition and Support Vector Machine

Author(s): Caio Bezerra Souto Maior ; Marcio das Chagas Moura ; Isis Didier Lins ; Enrique Lopez Droguett ; Helder Henrique Lima Diniz
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2016
Volume: 14
Page(s): 4,603 - 4,610
ISSN (Paper): 1548-0992
DOI: 10.1109/TLA.2016.7795836
Regular:

Knowledge on reliability and maintenance performance of physical assets can bring competitive advantages for companies (e.g., shorter downtimes and higher operation continuity). Prognostic and... View More

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