IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Multiresolution Approach to Model-Based 3-D Surface Quality Inspection

Author(s): Sebastian von Enzberg ; Ayoub Al-Hamadi
Sponsor(s): IEEE Industrial Electronics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2016
Volume: 12
Page(s): 1,498 - 1,507
ISSN (Paper): 1551-3203
ISSN (Online): 1941-0050
DOI: 10.1109/TII.2016.2585982
Regular:

We propose a novel model-based surface approximation method for three-dimensional (3-D) surface quality inspection that combines a machine learning approach with multiresolution paradigms.... View More

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