IEEE - Institute of Electrical and Electronics Engineers, Inc. - Semisupervised Kernel Learning for FDA Model and its Application for Fault Classification in Industrial Processes

Author(s): Zhiqiang Ge ; Shiyong Zhong ; Yingwei Zhang
Sponsor(s): IEEE Industrial Electronics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2016
Volume: 12
Page(s): 1,403 - 1,411
ISSN (Paper): 1551-3203
ISSN (Online): 1941-0050
DOI: 10.1109/TII.2016.2571680
Regular:

For fault classification in industrial processes, the performance of the classification model highly depends on the size of labeled dataset. Unfortunately, labeling the fault types of data samples... View More

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