IEEE - Institute of Electrical and Electronics Engineers, Inc. - Colorful 3-D Imaging Using an Infrared Dammann Grating

Author(s): Shengbin Wei ; Changhe Zhou ; Shaoqing Wang ; Kun Liu ; Xin Fan ; Jianyong Ma
Sponsor(s): IEEE Industrial Electronics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2016
Volume: 12
Page(s): 1,641 - 1,648
ISSN (Paper): 1551-3203
ISSN (Online): 1941-0050
DOI: 10.1109/TII.2016.2529423
Regular:

3-D profilometry is one of the most important branches of measurement science and technology. In this paper, a new colorful 3-D imaging method using near-infrared (NIR) laser (850 nm) dot array... View More

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