IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Big Data Clustering Algorithm for Mitigating the Risk of Customer Churn

Author(s): Wenjie Bi ; Meili Cai ; Mengqi Liu ; Guo Li
Sponsor(s): IEEE Industrial Electronics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2016
Volume: 12
Page(s): 1,270 - 1,281
ISSN (Paper): 1551-3203
ISSN (Online): 1941-0050
DOI: 10.1109/TII.2016.2547584
Regular:

As market competition intensifies, customer churn management is increasingly becoming an important means of competitive advantage for companies. However, when dealing with big data in the... View More

Advertisement