IEEE - Institute of Electrical and Electronics Engineers, Inc. - Unsupervised Diagnostic and Monitoring of Defects Using Waveguide Imaging With Adaptive Sparse Representation

Author(s): Bin Gao ; Wai Lok Woo ; Gui Yun Tian ; Hong Zhang
Sponsor(s): IEEE Industrial Electronics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 February 2016
Volume: 12
Page(s): 405 - 416
ISSN (Paper): 1551-3203
ISSN (Online): 1941-0050
DOI: 10.1109/TII.2015.2492924
Regular:

This paper proposes a new system for the unsupervised diagnostic and monitoring of defects in waveguide imaging. The proposed method is automatic and does not require manual selection of specific... View More

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