IEEE - Institute of Electrical and Electronics Engineers, Inc. - Unsupervised Sparse Pattern Diagnostic of Defects With Inductive Thermography Imaging System

Author(s): Bin Gao ; Wai Lok Woo ; Yunze He ; Gui Yun Tian
Sponsor(s): IEEE Industrial Electronics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 February 2016
Volume: 12
Page(s): 371 - 383
ISSN (Paper): 1551-3203
ISSN (Online): 1941-0050
DOI: 10.1109/TII.2015.2492925
Regular:

This paper proposes an unsupervised method for diagnosing and monitoring defects in inductive thermography imaging system. The proposed method is fully automated and does not require manual... View More

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