IEEE - Institute of Electrical and Electronics Engineers, Inc. - Application of Digital Holography for Nondestructive Testing and Metrology: A Review

Author(s): Thomas Kreis
Sponsor(s): IEEE Industrial Electronics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 February 2016
Volume: 12
Page(s): 240 - 247
ISSN (Paper): 1551-3203
ISSN (Online): 1941-0050
DOI: 10.1109/TII.2015.2482900
Regular:

Holography and holographic interferometry as a means for nondestructive testing, as well as metrologic tools in engineering, biology, and other fields, have significant momentum by the... View More

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