IEEE - Institute of Electrical and Electronics Engineers, Inc. - Feature Denoising and Nearest–Farthest Distance Preserving Projection for Machine Fault Diagnosis

Author(s): Weihua Li ; Shaohui Zhang ; Subhash Rakheja
Sponsor(s): IEEE Industrial Electronics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 February 2016
Volume: 12
Page(s): 393 - 404
ISSN (Paper): 1551-3203
ISSN (Online): 1941-0050
DOI: 10.1109/TII.2015.2475219
Regular:

It is a big challenge to identify the most effective features for enhancement of fault classification accuracy in rotating machines due to nonstationary and nonlinear vibration characteristics of... View More

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