IEEE - Institute of Electrical and Electronics Engineers, Inc. - Autocorrelation aided rough set based contamination level prediction of high voltage insulator at different environmental condition

Author(s): A. Banik ; S. Dalai ; B. Chatterjee
Sponsor(s): Nat. Natural Sci. Found. China
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2016
Volume: 23
Page(s): 2,883 - 2,891
ISSN (Paper): 1070-9878
DOI: 10.1109/TDEI.2016.7736849
Regular:

This paper presents a Rough Set Theory (RST) based approach for predicting the surface contamination level of porcelain type insulators at different environmental condition. The sample insulators... View More

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