IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fracture behavior of metallized electrode for capacitor under pulsed current

Author(s): Zhenglong Jiang ; Hua Li ; Bowen Wang ; Wenjuan Wang ; Haoyuan Li ; Junjia He ; Fuchang Lin
Sponsor(s): Nat. Natural Sci. Found. China
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2016
Volume: 23
Page(s): 2,517 - 2,525
ISSN (Paper): 1070-9878
DOI: 10.1109/TDEI.2016.7736808
Regular:

The fracture behavior of metallized electrode (ME) under pulsed current with current density of 1011~1012 A/m2 and pulse with width of microseconds is studied in... View More

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