IEEE - Institute of Electrical and Electronics Engineers, Inc. - Life estimation using damage equalization method and step-stress breakdown tests

Author(s): A. P. S. Tiwana ; C. C. Reddy
Sponsor(s): Nat. Natural Sci. Found. China
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2016
Volume: 23
Page(s): 2,311 - 2,318
ISSN (Paper): 1070-9878
DOI: 10.1109/TDEI.2016.7556508
Regular:

Conventional constant-stress accelerated ageing tests are time consuming, cumbersome and suffer from the disadvantage that some samples may not fail even after a long time. This necessitates... View More

Advertisement